James Edgar

 JamesH. Edgar

James H. Edgar

  • Courses4
  • Reviews6

Biography

Kansas State University - Chemical Engineering


Resume

  • 1981

    Doctor of Philosophy (PhD)

    Chemical Engineering

    University of Florida

  • 1978

    Bachelor of Science (BS)

    Chemical Engineering

    University of Kansas

  • Materials Science

    Nitride semiconductors

    Nanotechnology

    Crystal Growth

    Wet Chemical Etching

    Chemical Engineering

    Semiconductor Process

    Physics

    Defect Identification

    Teaching

    Higher Education

    Thermodynamics

    Boron compound semiconductors

    Experimentation

    Excellent electronic transport in heterostructures of graphene and monoisotopic boron-nitride grown at atmospheric pressure

    The properties of hBN single crystals produced by an atmospheric pressure process are compared to the best ever reported in the literature.

    Excellent electronic transport in heterostructures of graphene and monoisotopic boron-nitride grown at atmospheric pressure

    M.J. Kirkham

    Clinton Whiteley

    ournal of Physics and Chemistry of Solids

    The coefficients of thermal expansion for icosahedral boron arsenide are reported.

    The coefficient of thermal expansion of boron arsenide (B12As2) between 25 °C and 900 °C

    Takao Mori

    Isao Ohkubo

    Clint D. Frye

    Journal of the Physical Society of Japan

    The electrical conductivity and thermoelectric properties of B12As2 were measured as a function of temperature.

    Seebeck coefficient and electrical resistivity of single crystal B12As2 at high temperatures

    The properties of the insulator-gallium nitride interface are being optimized by developing an understanding of how process conditions impact the properties. Insulators with high dielectric constants such as alumina (Al2O3) and titanium dioxide (TiO2) are deposited on GaN by atomic layer deposition

    and their morphology

    structure

    and composition of the oxides are thoroughly characterized. Then the electrical properties are measured by capacitance-voltage measurements

    trends are identified

    and these are interpreted based on the physical and chemical properties. The goal is to establish the most important properties that are necessary

    so the oxides and nitrides can be combined to achieve high quality electronic device performance.

    N.Y. Garces

    N. Nepal

    Charles R. Eddy Jr.

    Daming Wei

    Tashfin Hossain

    Boron Phosphide Epitaxy on Silicon Carbide Substrates

    Boron phosphide is a semiconductor potentially useful for neutron detection. It is one of the few boron compound semiconductors for which both n- and p-type conductivity have been reported. In this project

    the epitaxy of BP on 4H-silicon carbide substrates is under study. This is a superior substrate to silicon

    as the lattice constants and coefficients of thermal expansion of BP and 4H-SiC are similar. Characterization of the structural and electrical properties are underway.

    Michael Dudley

    Balaji Raghothamachar

    Balabalaji Padavala

    Clint D. Frye

    Hexagonal Boron Nitride Crystal Growth

    Hexagonal boron nitride (hBN) is a wide band gap semiconductor that is structurally similar to graphite. hBN crystals are grown from metal solutions saturated with boron and nitrogen

    ie the flux growth method

    specifically

    from a combination of hBN

    nickel

    and chromium sources. A saturated molten solution is prepared by heating these components to 1525 °C. Crystals are then formed on the solution surface by slow cooling

    2-4 °C/h. Crystals form with their (0001) planes parallel to the solution surface. The maximum crystal size is approximately 2 mm in diameter that were 10 to 30 microns thick. The crystals have a single Raman peak at 1366 cm-1 with a narrow FWHM of 8 cm-1. The peak room temperature photoluminescence energy centered at 5.5 eV

    with a maximum energy at 5.75 eV. Etch pit densities from etching in molten potassium hydroxide for 1 minute at 430 °C were on the order 10e6 cm-2 to 10e7 cm-2.

    J.Y. Lin

    H.X. Jiang

    T.B. Hoffman

    K Snow

    B. Clubine

    Edgar

    James H.

    Edgar

    National Science Foundation (NSF)

    Radboud University Nijmegen

    Naval Research Laboratory

    Kansas State University

    Naval Research Laboratory

    National Science Foundation (NSF)

    Alexandria

    VA

    Temporary position as a director of the Electronic and Photonic Materials Program in the Division of Materials Research Division of the National Science Foundation.

    Program Director

    Kansas State University

    Guest Lecturer

    At Radboud University

    I investigated the hydride vapor phase epitaxy of scandium nitride on silicon carbide substrates. This semiconductor has applications as a thermoelectric material.

    Radboud University Nijmegen

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